Logo Mode (2): Multiple Foil (Hart-Parrish)

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Mode (2): Multiple Foil (Hart-Parrish)

This mode is often referred to as the Hart-Parrish mode after two of the authors in a relevant publication (Parrish, Hart & Huang, Journal of Applied Crystallography, 19, 92-100 [1986]). This method uses a series of thin finely spaced metal foils in front of the detector (note their orientation is quite different from the "Soller" slits you might have come across with laboratory powder diffractometers) as illustrated below.

Typical foils are made of stainless steel. On station 2.3 at the Daresbury SRS they are 350 mm long, 0.05 mm thick and separated by 0.1 or 0.2 mm. This means that only a narrowly divergent beam (0.03° or 0.06°, respectively) will pass through the foils and reach the detector, since X-rays more divergent than this will hit the foils and be absorbed. Now if we imagine the intersection of the plane of these foils with the incident (parallel) beam, then a region is defined (see schematic below) from which all detectable diffraction must originate. This feature of defining the diffraction region can be exploited in several ways (also see schematic below):
The main disadvantages of this mode are that the diffraction peak shape can be less regular and that the overall resolution is limited to only "medium-high" resolution. However for the correct application the results can be strikingly good. An example will be shown in a later part of the course.


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© Copyright 1997-2006.  Birkbeck College, University of London.
 
 
Author(s): Paul Barnes
Simon Jacques
Martin Vickers